Travelled to:1 × France
1 × USA
Collaborated with:X.Wen S.Kajihara M.Aso H.Furukawa Y.Yamato T.Suzuki Y.Ohsumi K.K.Saluja
Talks about:speed (2) test (2) scan (2) transit (1) generat (1) safeti (1) reduct (1) effect (1) critic (1) captur (1)
Person: Kohei Miyase
DBLP: Miyase:Kohei
Contributed to:
2011
2007Wrote 2 papers:
- DATE-2011-MiyaseWAFYK #generative #testing
- Transition-Time-Relation based capture-safety checking for at-speed scan test generation (KM, XW, MA, HF, YY, SK), pp. 895–898.
- DAC-2007-WenMSKOS #effectiveness #reduction #testing
- Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing (XW, KM, TS, SK, YO, KKS), pp. 527–532.