ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
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Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
DAC, 2008.

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@inproceedings{DAC-2008-ChoYBP,
	author        = "Minsik Cho and Kun Yuan and Yongchan Ban and David Z. Pan",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391598",
	isbn          = "978-1-60558-115-6",
	pages         = "504--509",
	publisher     = "{ACM}",
	title         = "{ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction}",
	year          = 2008,
}

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