Multiple defect diagnosis using no assumptions on failing pattern characteristics
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Xiaochun Yu, R. D. (Shawn) Blanton
Multiple defect diagnosis using no assumptions on failing pattern characteristics
DAC, 2008.

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@inproceedings{DAC-2008-YuB,
	author        = "Xiaochun Yu and R. D. (Shawn) Blanton",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391567",
	isbn          = "978-1-60558-115-6",
	pages         = "361--366",
	publisher     = "{ACM}",
	title         = "{Multiple defect diagnosis using no assumptions on failing pattern characteristics}",
	year          = 2008,
}

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