Xiaochun Yu, R. D. (Shawn) Blanton
Multiple defect diagnosis using no assumptions on failing pattern characteristics
DAC, 2008.
@inproceedings{DAC-2008-YuB, author = "Xiaochun Yu and R. D. (Shawn) Blanton", booktitle = "{Proceedings of the 45th Design Automation Conference}", doi = "10.1145/1391469.1391567", isbn = "978-1-60558-115-6", pages = "361--366", publisher = "{ACM}", title = "{Multiple defect diagnosis using no assumptions on failing pattern characteristics}", year = 2008, }