BibSLEIGH corpus
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Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
email twitter
Travelled to:
1 × France
2 × Germany
4 × USA
Collaborated with:
W.C.Tam O.Poku X.Yu J.E.Nelson J.G.Brown R.Desineni X.Ren V.G.Tavares S.Biswas P.Li L.T.Pileggi T.Zanon N.Patil W.Maly
Talks about:
diagnosi (3) multipl (2) circuit (2) failur (2) detect (2) defect (2) autom (2) test (2) use (2) dfm (2)

Person: R. D. (Shawn) Blanton

DBLP DBLP: Blanton:R=_D=_(Shawn)

Contributed to:

DATE 20152015
DAC 20112011
DAC 20092009
DAC 20082008
DAC 20062006
DATE 20062006
DATE 20052005

Wrote 8 papers:

DATE-2015-RenTB #detection #learning #statistics
Detection of illegitimate access to JTAG via statistical learning in chip (XR, VGT, RD(B), pp. 109–114.
DAC-2011-TamB #question
To DFM or not to DFM? (WCT, RD(B), pp. 65–70.
DAC-2009-TamPB #automation #validation
Automated failure population creation for validating integrated circuit diagnosis methods (WCT, OP, RD(B), pp. 708–713.
DAC-2008-TamPB #analysis #automation #layout #locality #precise #using
Precise failure localization using automated layout analysis of diagnosis candidates (WCT, OP, RD(B), pp. 367–372.
DAC-2008-YuB #fault #multi #using
Multiple defect diagnosis using no assumptions on failing pattern characteristics (XY, RD(B), pp. 361–366.
DAC-2006-NelsonBDB #detection #multi #physics
Multiple-detect ATPG based on physical neighborhoods (JEN, JGB, RD, RD(B), pp. 1099–1102.
DATE-2006-NelsonZDBPMB #fault
Extraction of defect density and size distributions from wafer sort test results (JEN, TZ, RD, JGB, NP, WM, RD(B), pp. 913–918.
DATE-2005-BiswasLBP #specification
Specification Test Compaction for Analog Circuits and MEMS (SB, PL, RD(B, LTP), pp. 164–169.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.