Statistical reliability analysis under process variation and aging effects
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Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan Yang, Xuan Zeng
Statistical reliability analysis under process variation and aging effects
DAC, 2009.

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@inproceedings{DAC-2009-LuSZZYZ,
	author        = "Yinghai Lu and Li Shang and Hai Zhou and Hengliang Zhu and Fan Yang and Xuan Zeng",
	booktitle     = "{Proceedings of the 46th Design Automation Conference}",
	doi           = "10.1145/1629911.1630044",
	isbn          = "978-1-60558-497-3",
	pages         = "514--519",
	publisher     = "{ACM}",
	title         = "{Statistical reliability analysis under process variation and aging effects}",
	year          = 2009,
}

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