Yun Ye, Frank Liu, Min Chen, Yu Cao
Variability analysis under layout pattern-dependent rapid-thermal annealing process
DAC, 2009.
@inproceedings{DAC-2009-YeLCC, author = "Yun Ye and Frank Liu and Min Chen and Yu Cao", booktitle = "{Proceedings of the 46th Design Automation Conference}", doi = "10.1145/1629911.1630054", isbn = "978-1-60558-497-3", pages = "551--556", publisher = "{ACM}", title = "{Variability analysis under layout pattern-dependent rapid-thermal annealing process}", year = 2009, }