Dimin Niu, Yiran Chen, Cong Xu, Yuan Xie
Impact of process variations on emerging memristor
DAC, 2010.
@inproceedings{DAC-2010-NiuCXX, author = "Dimin Niu and Yiran Chen and Cong Xu and Yuan Xie", booktitle = "{Proceedings of the 47th Design Automation Conference}", doi = "10.1145/1837274.1837495", isbn = "978-1-4503-0002-5", pages = "877--882", publisher = "{ACM}", title = "{Impact of process variations on emerging memristor}", year = 2010, }