Impact of process variations on emerging memristor
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Dimin Niu, Yiran Chen, Cong Xu, Yuan Xie
Impact of process variations on emerging memristor
DAC, 2010.

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@inproceedings{DAC-2010-NiuCXX,
	author        = "Dimin Niu and Yiran Chen and Cong Xu and Yuan Xie",
	booktitle     = "{Proceedings of the 47th Design Automation Conference}",
	doi           = "10.1145/1837274.1837495",
	isbn          = "978-1-4503-0002-5",
	pages         = "877--882",
	publisher     = "{ACM}",
	title         = "{Impact of process variations on emerging memristor}",
	year          = 2010,
}

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