Wujie Wen, Yaojun Zhang, Yiran Chen, Yu Wang, Yuan Xie
PS3-RAM: a fast portable and scalable statistical STT-RAM reliability analysis method
DAC, 2012.
@inproceedings{DAC-2012-WenZCWX, author = "Wujie Wen and Yaojun Zhang and Yiran Chen and Yu Wang and Yuan Xie", booktitle = "{Proceedings of the 49th Annual Design Automation Conference}", doi = "10.1145/2228360.2228580", isbn = "978-1-4503-1199-1", pages = "1191--1196", publisher = "{ACM}", title = "{PS3-RAM: a fast portable and scalable statistical STT-RAM reliability analysis method}", year = 2012, }