Verification of digitally-intensive analog circuits via kernel ridge regression and hybrid reachability analysis
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Honghuang Lin, Peng Li, Chris J. Myers
Verification of digitally-intensive analog circuits via kernel ridge regression and hybrid reachability analysis
DAC, 2013.

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@inproceedings{DAC-2013-LinLM,
	author        = "Honghuang Lin and Peng Li and Chris J. Myers",
	booktitle     = "{Proceedings of the 50th Annual Design Automation Conference}",
	doi           = "10.1145/2463209.2488814",
	isbn          = "978-1-4503-2071-9",
	pages         = "6",
	publisher     = "{ACM}",
	title         = "{Verification of digitally-intensive analog circuits via kernel ridge regression and hybrid reachability analysis}",
	year          = 2013,
}

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