Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb
Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults
DATE, 1998.
@inproceedings{DATE-1998-LindermeirVG,
author = "Walter M. Lindermeir and Thomas J. Vogels and Helmut E. Graeb",
booktitle = "{Proceedings of the Third Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1998.655953",
pages = "822--827",
publisher = "{IEEE Computer Society}",
title = "{Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults}",
year = 1998,
}