Travelled to:1 × France
Collaborated with:T.J.Vogels H.E.Graeb
Talks about:catastroph (1) parametr (1) measur (1) detect (1) design (1) analog (1) fault (1) test (1) idd (1)
Person: Walter M. Lindermeir
DBLP: Lindermeir:Walter_M=
Contributed to:
1998Wrote 1 papers:
- DATE-1998-LindermeirVG #design #detection #fault #metric #parametricity
- Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults (WML, TJV, HEG), pp. 822–827.