Michael Nicolaidis, Yervant Zorian
Scaling Deeper to Submicron: On-Line Testing to the Rescue
DATE, 1999.
@inproceedings{DATE-1999-NicolaidisZ, author = "Michael Nicolaidis and Yervant Zorian", booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.1999.761161", isbn = "0-7695-0078-1", pages = "432--None", publisher = "{IEEE Computer Society}", title = "{Scaling Deeper to Submicron: On-Line Testing to the Rescue}", year = 1999, }