BibSLEIGH — Michael

Travelled to:

4 × Germany
7 × France

Collaborated with:

Y.Zorian R.d.O.Duarte H.Bederr J.Velasco-Medina N.Zergainoh L.Anghel ∅ I.Alzaher-Noufal T.Bonnoit N.Achouri S.Boutobza E.Dupont P.Rohr I.Rayane T.Calin D.Avresky F.Chaix B.S.Gill F.G.Wolff C.A.Papachristou S.L.Garverick S.Hamdioui D.Gizopoulos A.Grasset G.Groeseneken P.Bonnot P.Muhmenthaler D.Y.Lepejian C.W.H.Strolenberg K.Veelenturf T.Karnik K.A.Bowman J.Tschanz S.Lu C.Tokunaga A.Raychowdhury M.M.Khellah J.Kulkarni V.De

Talks about:

fault (5) detect (4) design (4) multipli (3) embed (3) self (3) implement (2) reliabl (2) circuit (2) robust (2)

Person: Michael Nicolaidis

DBLP: Nicolaidis:Michael

Contributed to:

2013

2012

2011

2005

2003

2002

2000

1999

1998

1997

1994

Wrote 17 papers:

DATE-2013-HamdiouiNGGGB #challenge #realtime #reliability: Reliability challenges of real-time systems in forthcoming technology nodes (SH, MN, DG, AG, GG, PB), pp. 129–134.
DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability: Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
DATE-2011-ChaixAZN #adaptation #concurrent #fault tolerance: A fault-tolerant deadlock-free adaptive routing for on chip interconnects (FC, DA, NEZ, MN), pp. 909–912.
DATE-2011-NicolaidisBZ: Eliminating speed penalty in ECC protected memories (MN, TB, NEZ), pp. 1614–1619.
DATE-2005-GillNWPG #design #detection #performance: An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories (BSG, MN, FGW, CAP, SLG), pp. 592–597.
DATE-2003-NicolaidisAB #configuration management #self: Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair (MN, NA, SB), pp. 10590–10595.
DATE-2002-DupontNR #embedded #robust: Embedded Robustness Ips (ED, MN, PR), pp. 244–245.
DATE-2002-Nicolaidis #embedded #robust: IP for Embedded Robustness (MN), pp. 240–241.
DATE-2000-AnghelN #detection #evaluation #fault #reduction: Cost Reduction and Evaluation of a Temporary Faults Detecting Technique (LA, MN), pp. 591–598.
DATE-2000-ZorianNMLSV #tutorial: Tutorial Statement (YZ, MN, PM, DYL, CWHS, KV), p. 66.
DATE-1999-NicolaidisZ #online #scalability #testing: Scaling Deeper to Submicron: On-Line Testing to the Rescue (MN, YZ), p. 432–?.
DATE-1999-NoufalN #framework #generative #multi #self: A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes (IAN, MN), p. 122–?.
DATE-1999-RayaneVN #detection #embedded: A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection (IR, JVM, MN), p. 792–?.
DATE-1998-NicolaidisD #design #multi #predict: Design of Fault-Secure Parity-Prediction Booth Multipliers (MN, RdOD), pp. 7–14.
DATE-1998-Velasco-MedinaCN #detection #fault #injection #linear #using: Fault Detection for Linear Analog Circuits Using Current Injection (JVM, TC, MN), pp. 987–988.
EDTC-1997-DuarteNBZ #design #implementation: Fault-secure shifter design: results and implementations (RdOD, MN, HB, YZ), pp. 335–341.
EDAC-1994-NicolaidisB #array #implementation #multi #performance #self: Efficient Implementations of Self-Checking Multiply and Divide Arrays (MN, HB), pp. 574–579.