A. Toulouse, David Bernard, Christian Landrault, Pascal Nouet
Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts
DATE, 1999.
@inproceedings{DATE-1999-ToulouseBLN,
author = "A. Toulouse and David Bernard and Christian Landrault and Pascal Nouet",
booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1999.761185",
isbn = "0-7695-0078-1",
pages = "576--580",
publisher = "{IEEE Computer Society}",
title = "{Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts}",
year = 1999,
}











