Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts
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A. Toulouse, David Bernard, Christian Landrault, Pascal Nouet
Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts
DATE, 1999.

DATE 1999
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@inproceedings{DATE-1999-ToulouseBLN,
	author        = "A. Toulouse and David Bernard and Christian Landrault and Pascal Nouet",
	booktitle     = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1999.761185",
	isbn          = "0-7695-0078-1",
	pages         = "576--580",
	publisher     = "{IEEE Computer Society}",
	title         = "{Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts}",
	year          = 1999,
}

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