A. Toulouse, David Bernard, Christian Landrault, Pascal Nouet
Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts
DATE, 1999.
@inproceedings{DATE-1999-ToulouseBLN, author = "A. Toulouse and David Bernard and Christian Landrault and Pascal Nouet", booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.1999.761185", isbn = "0-7695-0078-1", pages = "576--580", publisher = "{IEEE Computer Society}", title = "{Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts}", year = 1999, }