Layout Compaction for Yield Optimization via Critical Area Minimization
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Youcef Bourai, C.-J. Richard Shi
Layout Compaction for Yield Optimization via Critical Area Minimization
DATE, 2000.

DATE 2000
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@inproceedings{DATE-2000-BouraiS,
	author        = "Youcef Bourai and C.-J. Richard Shi",
	booktitle     = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2000.840027",
	isbn          = "0-7695-0537-6",
	pages         = "122--125",
	publisher     = "{IEEE Computer Society}",
	title         = "{Layout Compaction for Yield Optimization via Critical Area Minimization}",
	year          = 2000,
}

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