Youcef Bourai, C.-J. Richard Shi
Layout Compaction for Yield Optimization via Critical Area Minimization
DATE, 2000.
@inproceedings{DATE-2000-BouraiS,
author = "Youcef Bourai and C.-J. Richard Shi",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840027",
isbn = "0-7695-0537-6",
pages = "122--125",
publisher = "{IEEE Computer Society}",
title = "{Layout Compaction for Yield Optimization via Critical Area Minimization}",
year = 2000,
}