A BIST Scheme for On-Chip ADC and DAC Testing
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Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
A BIST Scheme for On-Chip ADC and DAC Testing
DATE, 2000.

DATE 2000
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@inproceedings{DATE-2000-HuangOC,
	author        = "Jiun-Lang Huang and Chee-Kian Ong and Kwang-Ting Cheng",
	booktitle     = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2000.840041",
	isbn          = "0-7695-0537-6",
	pages         = "216--220",
	publisher     = "{IEEE Computer Society}",
	title         = "{A BIST Scheme for On-Chip ADC and DAC Testing}",
	year          = 2000,
}

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