Yervant Zorian
Yield Improvement and Repair Trade-Off for Large Embedded Memories
DATE, 2000.
@inproceedings{DATE-2000-Zorian,
author = "Yervant Zorian",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840018",
isbn = "0-7695-0537-6",
pages = "69--70",
publisher = "{IEEE Computer Society}",
title = "{Yield Improvement and Repair Trade-Off for Large Embedded Memories}",
year = 2000,
}











