Yervant Zorian
Yield Improvement and Repair Trade-Off for Large Embedded Memories
DATE, 2000.
@inproceedings{DATE-2000-Zorian, author = "Yervant Zorian", booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2000.840018", isbn = "0-7695-0537-6", pages = "69--70", publisher = "{IEEE Computer Society}", title = "{Yield Improvement and Repair Trade-Off for Large Embedded Memories}", year = 2000, }