Göran Jerke, Jens Lienig
Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits
DATE, 2002.
@inproceedings{DATE-2002-JerkeL, acmid = "874436", author = "Göran Jerke and Jens Lienig", booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2002.998314", isbn = "0-7695-1471-5", pages = "464--469", publisher = "{IEEE Computer Society}", title = "{Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits}", year = 2002, }