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Used together with:
reliabl (3)
avoid (3)
signal (3)
analysi (3)
grid (2)

Stem electromigr$ (all stems)

10 papers:

DACDAC-2014-HuangYST #assessment #grid #network #power management
Physics-based Electromigration Assessment for Power Grid Networks (XH, TY, VS, SXDT), p. 6.
DATEDATE-2014-SilvaLCH #multi
Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures (RMAeS, NCL, AC, NH), pp. 1–6.
DACDAC-2013-MishraS #grid #power management
The impact of electromigration in copper interconnects on power grid integrity (VM, SSS), p. 6.
DATEDATE-2011-YanC #multi
Obstacle-aware multiple-source rectilinear Steiner tree with electromigration and IR-drop avoidance (JTY, ZWC), pp. 449–454.
DACDAC-2004-JerkeLS #design #layout
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs (GJ, JL, JS), pp. 181–184.
DATEDATE-2002-JerkeL #analysis #verification
Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits (GJ, JL), pp. 464–469.
DACDAC-1998-NagarajCHY #analysis #approach
A Practical Approach to Static Signal Electromigration Analysis (NSN, FC, HH, DY), pp. 572–577.
DACDAC-1996-DasguptaK #process #reliability
Electromigration Reliability Enhancement via Bus Activity Distribution (AD, RK), pp. 353–356.
DACDAC-1996-TengCRK #reliability
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects (CCT, YKC, ER, SMK), pp. 752–757.
DACDAC-1991-Hwang #analysis #named
REX — A VLSI Parasitic Extraction Tool for Electromigration and Signal Analysis (JPH), pp. 717–722.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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