Stem electromigr$ (all stems)
10 papers:
DAC-2014-HuangYST #assessment #grid #network #power management- Physics-based Electromigration Assessment for Power Grid Networks (XH, TY, VS, SXDT), p. 6.
DATE-2014-SilvaLCH #multi- Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures (RMAeS, NCL, AC, NH), pp. 1–6.
DAC-2013-MishraS #grid #power management- The impact of electromigration in copper interconnects on power grid integrity (VM, SSS), p. 6.
DATE-2011-YanC #multi- Obstacle-aware multiple-source rectilinear Steiner tree with electromigration and IR-drop avoidance (JTY, ZWC), pp. 449–454.
DAC-2004-JerkeLS #design #layout- Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs (GJ, JL, JS), pp. 181–184.
DATE-2002-JerkeL #analysis #verification- Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits (GJ, JL), pp. 464–469.
DAC-1998-NagarajCHY #analysis #approach- A Practical Approach to Static Signal Electromigration Analysis (NSN, FC, HH, DY), pp. 572–577.
DAC-1996-DasguptaK #process #reliability- Electromigration Reliability Enhancement via Bus Activity Distribution (AD, RK), pp. 353–356.
DAC-1996-TengCRK #reliability- Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects (CCT, YKC, ER, SMK), pp. 752–757.
DAC-1991-Hwang #analysis #named- REX — A VLSI Parasitic Extraction Tool for Electromigration and Signal Analysis (JPH), pp. 717–722.