Hideyuki Ichihara, Tomoo Inoue
Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
DATE, 2003.
@inproceedings{DATE-2003-IchiharaI,
acmid = "1022909",
author = "Hideyuki Ichihara and Tomoo Inoue",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10057",
isbn = "0-7695-1870-2",
pages = "11180--11181",
publisher = "{IEEE Computer Society}",
title = "{Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG}",
year = 2003,
}