Functional constraints vs. test compression in scan-based delay testing
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Ilia Polian, Hideo Fujiwara
Functional constraints vs. test compression in scan-based delay testing
DATE, 2006.

DATE 2006
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@inproceedings{DATE-2006-PolianF,
	author        = "Ilia Polian and Hideo Fujiwara",
	booktitle     = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1131769",
	pages         = "1039--1044",
	publisher     = "{European Design and Automation Association, Leuven, Belgium}",
	title         = "{Functional constraints vs. test compression in scan-based delay testing}",
	year          = 2006,
}

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