A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap
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Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang
A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap
DATE, 2006.

DATE 2006
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@inproceedings{DATE-2006-TsengLC,
	author        = "Tsu-Wei Tseng and Jin-Fu Li and Da-Ming Chang",
	booktitle     = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1131498",
	pages         = "53--58",
	publisher     = "{European Design and Automation Association, Leuven, Belgium}",
	title         = "{A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap}",
	year          = 2006,
}

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