Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling
DATE, 2007.
@inproceedings{DATE-2007-WangCW,
author = "Zhanglei Wang and Krishnendu Chakrabarty and Seongmoon Wang",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266410",
isbn = "978-3-9810801-2-4",
pages = "201--206",
publisher = "{ACM}",
title = "{SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling}",
year = 2007,
}