Travelled to:1 × Germany
2 × USA
3 × France
Collaborated with:S.T.Chakradhar W.Wei S.K.Gupta M.C.Chao K.Cheng Z.Wang K.Chakrabarty K.J.Balakrishnan X.Liu
Talks about:test (7) unknown (4) scan (4) use (4) base (3) compactor (2) coverag (2) control (2) compact (2) reseed (2)
Person: Seongmoon Wang
DBLP: Wang:Seongmoon
Contributed to:
20092007
2006200620041997Wrote 8 papers:
- DATE-2009-WangW #machine learning
- Machine learning-based volume diagnosis (SW, WW), pp. 902–905.
- DATE-2007-WangCW #optimisation #scheduling #testing #using
- SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling (ZW, KC, SW), pp. 201–206.
- DATE-2007-WangWC
- Unknown blocking scheme for low control data volume and high observability (SW, WW, STC), pp. 33–38.
- DAC-2006-ChaoCWCW #analysis #using
- Unknown-tolerance analysis and test-quality control for test response compaction using space compactors (MCTC, KTC, SW, STC, WW), pp. 1083–1088.
- DATE-2006-ChaoWCWC #using
- Coverage loss by using space compactors in presence of unknown values (MCTC, SW, STC, WW, KTC), pp. 1053–1054.
- DATE-2006-WangBC #performance #using
- Efficient unknown blocking using LFSR reseeding (SW, KJB, STC), pp. 1051–1052.
- DATE-v2-2004-WangLC #fault #hardware #hybrid #testing
- Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets (SW, XL, STC), pp. 1296–1301.
- DAC-1997-WangG #testing
- ATPG for Heat Dissipation Minimization During Scan Testing (SW, SKG), pp. 614–619.