Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits
DATE, 2007.
@inproceedings{DATE-2007-ZjajoAG,
author = "Amir Zjajo and Manuel J. Barragan Asian and José Pineda de Gyvez",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266650",
isbn = "978-3-9810801-2-4",
pages = "1301--1306",
publisher = "{ACM}",
title = "{Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits}",
year = 2007,
}