Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits
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Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits
DATE, 2007.

DATE 2007
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@inproceedings{DATE-2007-ZjajoAG,
	author        = "Amir Zjajo and Manuel J. Barragan Asian and José Pineda de Gyvez",
	booktitle     = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1266366.1266650",
	isbn          = "978-3-9810801-2-4",
	pages         = "1301--1306",
	publisher     = "{ACM}",
	title         = "{Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits}",
	year          = 2007,
}

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