Songjun Pan, Yu Hu, Xiaowei Li
IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults
DATE, 2010.
@inproceedings{DATE-2010-PanHL, author = "Songjun Pan and Yu Hu and Xiaowei Li", booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}", pages = "238--243", publisher = "{IEEE}", title = "{IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults}", year = 2010, }