Songjun Pan, Yu Hu, Xiaowei Li
IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults
DATE, 2010.
@inproceedings{DATE-2010-PanHL,
author = "Songjun Pan and Yu Hu and Xiaowei Li",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "238--243",
publisher = "{IEEE}",
title = "{IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults}",
year = 2010,
}











