Loop flattening & spherical sampling: Highly efficient model reduction techniques for SRAM yield analysis
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Masood Qazi, Mehul Tikekar, Lara Dolecek, Devavrat Shah, Anantha Chandrakasan
Loop flattening & spherical sampling: Highly efficient model reduction techniques for SRAM yield analysis
DATE, 2010.

DATE 2010
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@inproceedings{DATE-2010-QaziTDSC,
	author        = "Masood Qazi and Mehul Tikekar and Lara Dolecek and Devavrat Shah and Anantha Chandrakasan",
	booktitle     = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
	pages         = "801--806",
	publisher     = "{IEEE}",
	title         = "{Loop flattening & spherical sampling: Highly efficient model reduction techniques for SRAM yield analysis}",
	year          = 2010,
}

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