Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation
DATE, 2011.
@inproceedings{DATE-2011-GielenMW,
author = "Georges G. E. Gielen and Elie Maricau and Peter H. N. De Wit",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "1474--1479",
publisher = "{IEEE}",
title = "{Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation}",
year = 2011,
}