Travelled to:3 × France
3 × Germany
Collaborated with:G.G.E.Gielen D.d.Jonghe P.H.N.D.Wit T.McConaghy B.Tasic H.D.Stratigopoulos J.Loeckx J.Martín-Martínez B.Kaczer G.Groeseneken R.Rodríguez M.Nafría
Talks about:reliabl (6) analog (5) circuit (4) nanomet (3) analysi (3) simul (3) cmos (3) stochast (2) variabl (2) model (2)
Person: Elie Maricau
DBLP: Maricau:Elie
Contributed to:
201320122011201020092008Wrote 8 papers:
- DATE-2013-GielenM #modelling #probability #simulation
- Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS (GGEG, EM), pp. 326–331.
- DATE-2012-JongheMGMTS #modelling #roadmap #testing #verification
- Advances in variation-aware modeling, verification, and testing of analog ICs (DdJ, EM, GGEG, TM, BT, HGDS), pp. 1615–1620.
- DATE-2012-MaricauJG #analysis #learning #multi #reliability #using
- Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection (EM, DdJ, GGEG), pp. 745–750.
- DATE-2011-GielenMW #analysis #reliability
- Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation (GGEG, EM, PHNDW), pp. 1474–1479.
- DATE-2011-MaricauG #analysis #probability #reliability
- Stochastic circuit reliability analysis (EM, GGEG), pp. 1285–1290.
- DATE-2010-MaricauG #complexity #reliability #simulation #variability
- Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity (EM, GGEG), pp. 1094–1099.
- DATE-2009-MaricauG #performance #reliability #simulation #variability
- Efficient reliability simulation of analog ICs including variability and time-varying stress (EM, GGEG), pp. 1238–1241.
- DATE-2008-GielenWMLMKGRN #challenge #reliability
- Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies (GGEG, PHNDW, EM, JL, JMM, BK, GG, RR, MN), pp. 1322–1327.