A scan pattern debugger for partial scan industrial designs
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Kameshwar Chandrasekar, Supratik K. Misra, Sanjay Sengupta, Michael S. Hsiao
A scan pattern debugger for partial scan industrial designs
DATE, 2012.

DATE 2012
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@inproceedings{DATE-2012-ChandrasekarMSH,
	acmid         = "2492847",
	author        = "Kameshwar Chandrasekar and Supratik K. Misra and Sanjay Sengupta and Michael S. Hsiao",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "558--561",
	publisher     = "{IEEE}",
	title         = "{A scan pattern debugger for partial scan industrial designs}",
	year          = 2012,
}

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