Kameshwar Chandrasekar, Supratik K. Misra, Sanjay Sengupta, Michael S. Hsiao
A scan pattern debugger for partial scan industrial designs
DATE, 2012.
@inproceedings{DATE-2012-ChandrasekarMSH,
acmid = "2492847",
author = "Kameshwar Chandrasekar and Supratik K. Misra and Sanjay Sengupta and Michael S. Hsiao",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "558--561",
publisher = "{IEEE}",
title = "{A scan pattern debugger for partial scan industrial designs}",
year = 2012,
}
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