Travelled to:
2 × Germany
Collaborated with:
M.S.Hsiao S.K.Misra S.Sengupta
Talks about:
scan (2) increment (1) techniqu (1) industri (1) satisfi (1) pattern (1) partial (1) generat (1) integr (1) effici (1)
Person: Kameshwar Chandrasekar
DBLP: Chandrasekar:Kameshwar
Contributed to:
Wrote 2 papers:
- DATE-2012-ChandrasekarMSH #debugging #design #industrial
- A scan pattern debugger for partial scan industrial designs (KC, SKM, SS, MSH), pp. 558–561.
- DATE-2005-ChandrasekarH #fault #generative #incremental #integration #learning #performance #satisfiability #testing
- Integration of Learning Techniques into Incremental Satisfiability for Efficient Path-Delay Fault Test Generation (KC, MSH), pp. 1002–1007.