Abbas Rahimi, Luca Benini, Rajesh K. Gupta
Analysis of instruction-level vulnerability to dynamic voltage and temperature variations
DATE, 2012.
@inproceedings{DATE-2012-RahimiBG, acmid = "2492980", author = "Abbas Rahimi and Luca Benini and Rajesh K. Gupta", booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}", isbn = "978-1-4577-2145-8", pages = "1102--1105", publisher = "{IEEE}", title = "{Analysis of instruction-level vulnerability to dynamic voltage and temperature variations}", year = 2012, }