@inproceedings{DATE-2012-RichterC,
	acmid         = "2492904",
	author        = "Michael Richter and Krishnendu Chakrabarty",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "787--792",
	publisher     = "{IEEE}",
	title         = "{Test pin count reduction for NoC-based Test delivery in multicore SOCs}",
	year          = 2012,
}