@inproceedings{DATE-2013-SarrazinENBG,
	acmid         = "2485550",
	author        = "Sébastien Sarrazin and Samuel Evain and Lirida Alves de Barros Naviner and Yannick Bonhomme and Valentin Gherman",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "1077--1082",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection}",
	year          = 2013,
}