Optimization of standard cell based detailed placement for 16 nm FinFET process
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Yuelin Du, Martin D. F. Wong
Optimization of standard cell based detailed placement for 16 nm FinFET process
DATE, 2014.

DATE 2014
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@inproceedings{DATE-2014-DuW,
	author        = "Yuelin Du and Martin D. F. Wong",
	booktitle     = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.7873/DATE.2014.370",
	pages         = "1--6",
	publisher     = "{IEEE}",
	title         = "{Optimization of standard cell based detailed placement for 16 nm FinFET process}",
	year          = 2014,
}

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