Michael E. Imhof, Hans-Joachim Wunderlich
Bit-Flipping Scan — A unified architecture for fault tolerance and offline test
DATE, 2014.
@inproceedings{DATE-2014-ImhofW,
author = "Michael E. Imhof and Hans-Joachim Wunderlich",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.206",
pages = "1--6",
publisher = "{IEEE}",
title = "{Bit-Flipping Scan — A unified architecture for fault tolerance and offline test}",
year = 2014,
}