Travelled to:1 × France
1 × Germany
3 × USA
Collaborated with:H.Wunderlich C.G.Zoellin J.Leenstra N.Mäding M.A.Kochte H.Zhang L.Bauer J.Henkel M.Elm R.S.Khaligh M.Radetzki S.D.Carlo P.Prinetto
Talks about:test (4) scan (3) reduct (2) power (2) architectur (1) reconfigur (1) transact (1) reliabl (1) cluster (1) system (1)
Person: Michael E. Imhof
DBLP: Imhof:Michael_E=
Contributed to:
2014
2014200920082007Wrote 5 papers:
- DAC-2014-ZhangKIBWH #configuration management #named #reliability
- GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems (HZ, MAK, MEI, LB, HJW, JH), p. 6.
- DATE-2014-ImhofW #architecture #fault tolerance
- Bit-Flipping Scan — A unified architecture for fault tolerance and offline test (MEI, HJW), pp. 1–6.
- DATE-2009-KochteZIKRWCP #modelling #transaction #using #validation
- Test exploration and validation using transaction level models (MAK, CGZ, MEI, RSK, MR, HJW, SDC, PP), pp. 1250–1253.
- DAC-2008-ElmWIZLM #clustering #reduction
- Scan chain clustering for test power reduction (ME, HJW, MEI, CGZ, JL, NM), pp. 828–833.
- DAC-2007-ImhofZWML #reduction #testing
- Scan Test Planning for Power Reduction (MEI, CGZ, HJW, NM, JL), pp. 521–526.