Masaaki Kondo, Hiroaki Kobayashi, Ryuichi Sakamoto, Motoki Wada, Jun Tsukamoto, Mitaro Namiki, Weihan Wang, Hideharu Amano, Kensaku Matsunaga, Masaru Kudo, Kimiyoshi Usami, Toshiya Komoda, Hiroshi Nakamura
Design and evaluation of fine-grained power-gating for embedded microprocessors
DATE, 2014.
@inproceedings{DATE-2014-KondoKSWTNWAMKUKN,
author = "Masaaki Kondo and Hiroaki Kobayashi and Ryuichi Sakamoto and Motoki Wada and Jun Tsukamoto and Mitaro Namiki and Weihan Wang and Hideharu Amano and Kensaku Matsunaga and Masaru Kudo and Kimiyoshi Usami and Toshiya Komoda and Hiroshi Nakamura",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.158",
pages = "1--6",
publisher = "{IEEE}",
title = "{Design and evaluation of fine-grained power-gating for embedded microprocessors}",
year = 2014,
}