Quick error detection tests with fast runtimes for effective post-silicon validation and debug
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David Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra
Quick error detection tests with fast runtimes for effective post-silicon validation and debug
DATE, 2015.

DATE 2015
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@inproceedings{DATE-2015-LinSKRM,
	acmid         = "2757083",
	author        = "David Lin and Eswaran S and Sharad Kumar and Eric Rentschler and Subhasish Mitra",
	booktitle     = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-3-9815370-4-8",
	pages         = "1168--1173",
	publisher     = "{ACM}",
	title         = "{Quick error detection tests with fast runtimes for effective post-silicon validation and debug}",
	year          = 2015,
}

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