Travelled to:
1 × France
Collaborated with:
D.Lin E.S S.Kumar S.Mitra
Talks about:
silicon (1) runtim (1) effect (1) detect (1) valid (1) quick (1) error (1) debug (1) test (1) post (1)
Person: Eric Rentschler
DBLP: Rentschler:Eric
Contributed to:
Wrote 1 papers:
- DATE-2015-LinSKRM #debugging #detection #effectiveness #fault #performance #testing #validation
- Quick error detection tests with fast runtimes for effective post-silicon validation and debug (DL, ES, SK, ER, SM), pp. 1168–1173.