S. Bernardini, Jean Michel Portal, Pascal Masson
A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology
DATE, 2004.
@inproceedings{DATE-v2-2004-BernardiniPM,
author = "S. Bernardini and Jean Michel Portal and Pascal Masson",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
doi = "10.1109/DATE.2004.1269108",
isbn = "0-7695-2085-5",
pages = "1404--1405",
publisher = "{IEEE Computer Society}",
title = "{A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology}",
year = 2004,
}