Travelled to:
1 × France
Collaborated with:
S.Bernardini J.M.Portal
Talks about:
technolog (1) tunnel (1) micron (1) failur (1) model (1) oxid (1) gate (1) deep (1) sub (1)
Person: Pascal Masson
DBLP: Masson:Pascal
Contributed to:
Wrote 1 papers:
- DATE-v2-2004-BernardiniPM
- A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology (SB, JMP, PM), pp. 1404–1405.