BibSLEIGH corpus
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Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
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Used together with:
gate (4)
model (4)
leakag (3)
circuit (2)
due (2)

Stem oxid$ (all stems)

6 papers:

Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown (VC, RCA), pp. 1172–1175.
DATEDATE-2005-CarterOS #concurrent #fault #modelling #testing
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown (JRC, SO, DJS), pp. 300–305.
DACDAC-2004-SultaniaSS #trade-off
Tradeoffs between date oxide leakage and delay for dual Tox circuits (AKS, DS, SSS), pp. 761–766.
A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology (SB, JMP, PM), pp. 1404–1405.
DACDAC-2003-LeeKBS #analysis
Analysis and minimization techniques for total leakage considering gate oxide leakage (DL, WK, DB, DS), pp. 175–180.
DACDAC-2000-TianWB #modelling
Model-based dummy feature placement for oxide chemical-mechanical polishing manufacturability (RT, DFW, RB), pp. 667–670.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.