Functional Tests for Ring-Address SRAM-type FIFOs
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A. J. van de Goor, Yervant Zorian, Ivo Schanstra
Functional Tests for Ring-Address SRAM-type FIFOs
DATE, 1994.

EDAC 1994
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@inproceedings{EDAC-1994-AGZS,
	author        = "A. J. van de Goor and Yervant Zorian and Ivo Schanstra",
	booktitle     = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
	isbn          = "0-8186-5410-4",
	pages         = "666",
	publisher     = "{IEEE Computer Society}",
	title         = "{Functional Tests for Ring-Address SRAM-type FIFOs}",
	year          = 1994,
}

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