A. J. van de Goor, Yervant Zorian, Ivo Schanstra
Functional Tests for Ring-Address SRAM-type FIFOs
DATE, 1994.
@inproceedings{EDAC-1994-AGZS,
author = "A. J. van de Goor and Yervant Zorian and Ivo Schanstra",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "666",
publisher = "{IEEE Computer Society}",
title = "{Functional Tests for Ring-Address SRAM-type FIFOs}",
year = 1994,
}