Travelled to:1 × France
1 × Germany
Collaborated with:A.J.v.d.Goor Y.Zorian
Talks about:test (2) function (1) coverag (1) consequ (1) address (1) bitlin (1) twist (1) type (1) sram (1) ring (1)
Person: Ivo Schanstra
DBLP: Schanstra:Ivo
Contributed to:
20031994Wrote 2 papers:
- DATE-2003-SchanstraG #ram #test coverage
- Consequences of RAM Bitline Twisting for Test Coverage (IS, AJvdG), pp. 11176–11177.
- EDAC-1994-AGZS #functional #testing
- Functional Tests for Ring-Address SRAM-type FIFOs (AJvdG, YZ, IS), p. 666.