Eugeni Isern, Joan Figueras
Test of Bridging Faults in Scan-based Sequential Circuits
DATE, 1994.
@inproceedings{EDAC-1994-IsernF,
author = "Eugeni Isern and Joan Figueras",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "366--370",
publisher = "{IEEE Computer Society}",
title = "{Test of Bridging Faults in Scan-based Sequential Circuits}",
year = 1994,
}