Travelled to:
1 × France
Collaborated with:
J.Figueras
Talks about:
sequenti (1) circuit (1) fault (1) bridg (1) test (1) scan (1) base (1)
Person: Eugeni Isern
DBLP: Isern:Eugeni
Contributed to:
Wrote 1 papers:
- EDAC-1994-IsernF #fault
- Test of Bridging Faults in Scan-based Sequential Circuits (EI, JF), pp. 366–370.