Travelled to:2 × Germany
Collaborated with:E.Alpaslan J.Dworak B.Kruseman W.M.Heuvelman P.v.d.Wiel M.Azimane G.Gronthoud M.Lousberg S.Eichenberger F.Bowen
Talks about:industri (1) silicon (1) discrep (1) between (1) stress (1) memori (1) differ (1) condit (1) under (1) simul (1)
Person: Ananta K. Majhi
DBLP: Majhi:Ananta_K=
Contributed to:
20102005Wrote 2 papers:
- DATE-2010-AlpaslanDKMHW #simulation
- NIM- a noise index model to estimate delay discrepancies between silicon and simulation (EA, JD, BK, AKM, WMH, PvdW), pp. 1373–1376.
- DATE-2005-MajhiAGLEB #evaluation #industrial #memory management #testing
- Memory Testing Under Different Stress Conditions: An Industrial Evaluation (AKM, MA, GG, ML, SE, FB), pp. 438–443.