Travelled to:1 × Germany
Collaborated with:E.Alpaslan J.Dworak B.Kruseman A.K.Majhi W.M.Heuvelman
Talks about:silicon (1) discrep (1) between (1) simul (1) model (1) index (1) estim (1) delay (1) nois (1) nim (1)
Person: Paul van de Wiel
DBLP: Wiel:Paul_van_de
Contributed to:
2010Wrote 1 papers:
- DATE-2010-AlpaslanDKMHW #simulation
- NIM- a noise index model to estimate delay discrepancies between silicon and simulation (EA, JD, BK, AKM, WMH, PvdW), pp. 1373–1376.