Travelled to:1 × Italy
1 × Korea
1 × USA
Collaborated with:J.Pilz C.D.Luca J.Kaspar
Talks about:semiconductor (2) manufactur (2) metrolog (2) virtual (2) system (2) sampl (2) decis (2) use (2) bayesian (1) reliabl (1)
Person: Daniel Kurz
DBLP: Kurz:Daniel
Contributed to:
201320122011Wrote 3 papers:
- CASE-2013-KurzDP #monitoring #reliability
- Monitoring virtual metrology reliability in a sampling decision system (DK, CDL, JP), pp. 20–25.
- CASE-2012-KurzDP #using
- Sampling Decision System in semiconductor manufacturing using Virtual Metrology (DK, CDL, JP), pp. 74–79.
- CASE-2011-KurzKP #maintenance #network #using
- Dynamic Maintenance in semiconductor manufacturing using Bayesian networks (DK, JK, JP), pp. 238–243.